Workshops
& Tutorials

Announcing the Workshop and Tutorial Sessions Planned for the Spokane Symposium!

By John Maas and Flavia Grassi, Workshop and Tutorial Committee Co-Chairs


This year, we had a record number of workshop and tutorials proposals submitted for the 2022 IEEE International Symposium on EMC+SIPI to be held in Spokane, Washington from August 1-5. After careful review, we are pleased to announce the following workshop and tutorial titles along with the names of the organizers. Please check the Advance Program available soon on the Symposium website for the workshop and tutorial abstracts, the complete list of speakers in each workshop and tutorial, as well as the schedule. Note this year, the workshops and tutorials will be scheduled throughout the week to accommodate the overwhelming number of excellent workshops and tutorials. This means you can attend one of the most popular sessions in the technical program each day of the symposium week, from Monday to Friday!

We extend our gratitude to the workshop and tutorial organizers shown below for enriching the Spokane Symposium technical program with many excellent and diverse topics of interest to the EMC and SIPI communities.

Fundamentals of EMC 
John McCloskey, NASA/Goddard Space Flight Center, College Park, MD, USA
Jen Dimov, NASA, Bowie, MD, USA

Application of Reverb Chambers
Vignesh Rajamani, Exponent Inc, Phoenix, AZ, USA

Smart Grid and EMC Issues 
Michael McInerney, Champaign, IL, USA
William Radasky, Metatech Corporation, Goleta, CA, USA

Product Safety Compliance and Global Market Access
Grant Schmidbauer, Nemko North America, Inc., Carlsbad, CA, USA
Ken Kapur, Thermo Fisher Scientific Inc., Saratoga, CA, USA
John Allen, Product Safety Consulting, Inc., Bensenville, IL, USA

Automotive EMC Standards and Instrumentation Update 
Garth D’Abreu, ETS-Lindgren, Cedar Park, TX, USA
Craig Fanning, Elite Electronic Engineering, Inc., Downers Grove, IL, USA

Low Frequency EMI and Modeling of Conducted Interference in Systems with Multiple Converters
Denys Pokotilov, Universiteit Twente, Enschede, Netherlands
Karol Niewiadomski, University of Nottingham, Nottingham, UK

Basic EMC Measurements 
Monrad Monsen, Oracle, Broomfield, CO, USA

EMC Test and Design for Cables and Connectors
Charles Jullien, Safran Electrical and Power, Blagnac, France 
Huadong Li, Molex LLC, Naperville, IL, USA

EMC Testing Basics
Doug Kramer, ETS-Lindgren, Cedar Park, TX, USA
Bob Mitchell, TÜV Rheinland North America, Townsend, MA, USA

Recent Advancements in HEMP, EMP, and IEMI Protection – A Global Perspective 
Tara Kellogg, ETS-Lindgren, Cedar Park, TX, USA
Frank Sabath, Bundeswehr Research Institute for Protective Technologies and NBC Protection, Garstedt, Germany

Introduction to Power Electronics Electromagnetic Interference Analysis and Suppression
Shuo Wang, University of Florida, Gainesville, FL, USA 
Cong Li, GE Global Research, Niskayuna, NY, USA
Mingchang Wang, Dell, Kanata, Ontario, Canada
Chulsoon Hwang, Missouri University of Science and Technology, Rolla, MI, USA

Lessons Learned Creating Reliable Computational Models for SI and EMC Applications 
Patrick DeRoy, Analog Devices Inc, Norwood, MA, USA

Model Based System Engineering, Mode Filtering, Robotics: Modern Antenna Measurement Techniques for EMC and RF Applications
Zhong Chen, ETS-Lindgren, Cedar Park, TX, USA
Dennis Lewis, The Boeing Company, Seattle, WA, USA

Advancing Simulation Tools and Computational Methods with Packaging Benchmarks
Heidi Barnes, Keysight Technologies Inc, Forestville, CA, USA
Vladimir Okhmatovski, University of Manitoba, Winnipeg, Manitoba, Canada

Automotive EMC – Advances in Design and Test Methodologies
Garth D’Abreu, ETS-Lindgren, Cedar Park, TX, USA
Robert Kado, Stellantis, Grosse Pointe, MI, USA

Site Validation Standards by the American National Standards Committee C63® on EMC
Daniel Hoolihan, Hoolihan EMC Consulting, Lindstrom, MN, USA

Becoming a Successful Book Author for the IEEE EMC Society
Reinaldo Perez, Jet Propulsion Laboratory, Denver, CO, USA

EM Resilience: Managing Functional Safety and Other Risks with Regard to Electromagnetic Disturbances 
Davy Pissoort, Katholieke Universiteit Leuven, Bruges, Belgium
Keith Armstrong, Cherry Clough Consultants Ltd, Stafford, UK

Ham Radio Through History and Today 
Karen Burnham, Electro Magnetic Applications, Inc., Lakewood, CO, USA
Kimball Williams, IEEE, Dearborn, MI, USA

Innovative Wireless Test Methodologies for 5G New Radio and mmWave Applications
Michael Foegelle, ETS-Lindgren, Cedar Park, TX, USA
Harry Skinner, Intel Corporation, Hillsboro, OR, USA

Introduction to EMI Modeling Techniques 
Karen Burnham, Electro Magnetic Applications, Inc., Lakewood, CO, USA
Scott Piper, General Motors Corp., Canton, MI, USA

Full System EMC Simulation using Encrypted 3D Components
Juliano Mologni, ANSYS, Rochester, MI, USA
Timothy McDonald, Electro Magnetic Applications, Inc., Lakewood, CO, USA

EMC Overview of Tests Applicable to 5G and WLAN Devices in Brazil
Deiverson Flausino, Orbis Compliance, Silicon Valley, CA, USA
Elizabeth Perrier, Orbis Compliance, Silicon Valley, CA, USA

Introduction to 5G and Related Health Effects Issues 
Robert Olsen, Washington State University, Pullman, WA, USA

Risk-Based EMC Initiatives in Europe
Marc Kopf, Technische Universiteit Eindhoven, Eindhoven, Netherlands
Geon Bastian, IDNEO Technologies, Barcelona, Spain

Signal Integrity Methods for Card, Connector, and Baseboard: PCI Express® 64.0 GT/s Performance on a Budget 
Timothy Wig, Intel Corp., Northborough, MA, USA

Electromagnetic Compatibility of Track Circuits with the Traction Supply System of Railway
Tetiana Serdiuk, Ukrainian State University of Science and Technologies, Dnipro, Ukraine
Volodymyr Havryliuk, Dnipropetrovs'kij Natsionalnyj Universitet Zaliznichnogo Transportu, Dnipro, Ukraine

 


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